The crystallography and texture of Co-based thin film deposited on Cr underlayers

摘要

Some of the evidence for the effect of Cr orientation on the crystallographic orientation of Co-based thin films is presented. The authors review four experimental techniques that can be used to investigate the orientation relationships (OR) between the magnetic Co-based film and the Cr underlayer. These techniques are X-ray diffraction, selected area (electron) diffraction (SAD), electron microdiffraction, and atomic resolution electron microscopy of cross sections of the bi-layer films. The authors focus on the crystallographic orientation relationships between the grains in the magnetic film and those in the Cr (BCC) underlayer. The magnetic films discussed are all alloys of Co, usually with HCP structure.