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Thermal stability of narrow track bits in a 5 Gbit/in/sup 2/ medium

机译:5 Gbit / in / sup 2 /介质中窄轨位的热稳定性

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摘要

The thermal stability of high density written bits in a 5 Gbit/in/sup 2/ CoCrPtTa/CrMo medium is examined using a magnetic force microscope. Images of the same 0.8 /spl mu/m-track all-ones pattern were taken before and after various anneal schedules. Written bits, which for the measured magneto-crystalline anisotropy and switching volume, are predicted by simulation studies to be thermally unstable reveal no significant degradation with annealing up to 490 K for 2 hours. This discrepancy emphasizes the need for more realistic theoretical models.
机译:使用磁力显微镜检查5 Gbit / in / sup 2 / CoCrPtTa / CrMo介质中高密度写入位的热稳定性。在各种退火计划前后,都拍摄了相同的0.8 / spl mu / m轨道全一模式的图像。通过模拟研究预测,对于测量的磁晶各向异性和开关量而言,写入位是热不稳定的,表明在490 K退火2小时后不会出现明显的退化。这种差异强调需要更现实的理论模型。

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