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Second-harmonic magneto-optic Kerr effect from spin-valve test structures: correlation with magnetoresistance response

机译:自旋阀测试结构的二次谐波磁光Kerr效应:与磁阻响应的相关性

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摘要

We have simultaneously measured the second-harmonic magneto-optic Kerr effect and the magnetoresistance of patterned Ta/Ni/sub 81/Fe/sub 19//Cu/Ni/sub 81/Fe/sub 19//Ta spin-valve test structures. For fields applied parallel to the bias-current direction, we observed a one-to-one correlation between the magnetoresistance and the magnetization-dependent second-harmonic intensity. The dependence of the second-harmonic intensity on magnetic field indicates that the detected second-harmonic response arises largely from the top Ni/sub 81/Fe/sub 19//Ta interface. The existence of this one-to-one correlation implies that the second harmonic depends linearly on magnetization, thus offering a method for interface-specific magnetometry.
机译:我们同时测量了二次谐波磁光Kerr效应和图案化Ta / Ni / sub 81 / Fe / sub 19 // Cu / Ni / sub 81 / Fe / sub 19 // Ta自旋阀测试结构的磁阻。对于平行于偏置电流方向施加的磁场,我们观察到了磁阻与磁化强度相关的二次谐波强度之间的一对一关系。二次谐波强度对磁场的依赖性表明,检测到的二次谐波响应主要来自顶部的Ni / sub 81 / Fe / sub 19 // Ta界面。一对一相关性的存在意味着二次谐波线性依赖于磁化强度,因此提供了一种界面特定的磁力测量方法。

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