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Demonstration of a four state sensing scheme for a single Pseudo-Spin Valve GMR bit

机译:单个伪自旋阀GMR位的四种状态检测方案的演示

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摘要

A simple and fast method for sensing four states from a single Pseudo-Spin Valve GMR device is presented. Four state sensing shows promise of doubling the potential bit density of Magnetic Random Access Memory (MRAM) and related devices. A new two step method to detect the GMR bit information has been developed here that is simple to implement and which easily allows for compensation of rapid self-heating effects.
机译:提出了一种简单快速的方法,可从单个伪自旋阀GMR设备检测四个状态。四个状态感测显示了将磁性随机存取存储器(MRAM)和相关设备的潜在位密度加倍的希望。这里已经开发了一种新的两步法来检测GMR比特信息,该方法易于实现,并且易于补偿快速的自热效应。

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