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High precision magnetostriction measurement employing the B-H looper bending method

机译:使用B-H弯针弯曲法的高精度磁致伸缩测量

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摘要

We report a simple, nondestructive B-H looper bending method for measuring 10/sup -7/ of magnetostriction (/spl lambda/) in thin films (/spl sim/150 /spl Aring/). The new method improves the accuracy and repeatability of /spl Delta/H/sub k/ measurements in loopers by employing a measurement sequence that corrects the non-repeatable balance errors. For the 150 /spl Aring/ thick NiFe films under an anisotropic strain of 4.6/spl times/10/sup -5/, we achieved a /spl Delta/H/sub k/ repeatability, 1/spl sigma/=0.009 Oe which is equivalent to 3.4/spl times/10/sup -8/ in /spl lambda/. Our technique gives /spl lambda/ values that agree well with the optical cantilever bending technique and can be easily utilized in a thin-film head production environment for accurate control of /spl lambda/.
机译:我们报告了一种简单,无损的B-H弯针弯曲方法,用于测量薄膜(/ spl sim / 150 / spl Aring /)的磁致伸缩(/ spl lambda /)的10 / sup -7 /。通过采用校正不可重复的平衡误差的测量序列,新方法提高了弯针中/ spl Delta / H / sub k /测量的准确性和可重复性。对于各向异性应变为4.6 / spl次/ 10 / sup -5 /的150张/ spl Aring /厚NiFe薄膜,我们获得了/ spl Delta / H / sub k /重复性,1 / spl sigma / = 0.009 Oe,等于/ spl lambda /中的3.4 / spl次/ 10 / sup -8 /。我们的技术提供的/ spl lambda /值与光学悬臂弯曲技术非常吻合,并且可以轻松地用于薄膜磁头生产环境中以精确控制/ spl lambda /。

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