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首页> 外文期刊>IEEE Transactions on Magnetics >Measurement of Thickness Distribution of Molecularly Thin Lubricant Films on Head Sliders Using Ellipsometric Microscopy
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Measurement of Thickness Distribution of Molecularly Thin Lubricant Films on Head Sliders Using Ellipsometric Microscopy

机译:椭偏显微镜测量头滑块上分子薄润滑剂膜的厚度分布

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Lubricant transfer or pickup from a disk to head slider is a crucial issue in designing the head–disk interfaces with a reduced head–disk gap. Observation of lubricant on the slider is difficult with the conventional methods due to their limited lateral resolution. In this paper, nanometer-thick lubricant on a slider was observed by using vertical-objective-based ellipsometric microscopy (VEM). The lubricant thickness was evaluated using a null-ellipsometric method. The thickness measured by VEM agreed fairly well with that by atomic force microscopy. The temporal change in the thickness of a nanometer-thick lubricant film distribution around a read/write element in the slider was successfully observed with a lateral resolution of the order of .
机译:润滑剂从磁盘到磁头滑块的转移或拾取是设计磁头-磁盘接口并减小磁头-磁盘间隙的关键问题。由于传统方法的横向分辨率有限,因此很难在滑块上观察润滑剂。在本文中,使用基于垂直物镜的椭偏显微镜(VEM)观察到了滑块上的纳米级润滑剂。使用零偏椭圆法评估润滑剂厚度。 VEM测得的厚度与原子力显微镜测得的厚度相当吻合。成功地观察到滑动器中读/写元件周围纳米级润滑膜分布厚度的时间变化,横向分辨率约为。

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