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首页> 外文期刊>IEEE transactions on device and materials reliability >Usage of Laser Timing Probe for Sensing of Programmed Charges in EEPROM Devices
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Usage of Laser Timing Probe for Sensing of Programmed Charges in EEPROM Devices

机译:激光定时探针在EEPROM器件中感应程序电荷的用途

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摘要

A method to measure programmed charges in EEPROM devices is presented. The measurement of the charges was made with subtraction of images captured using a laser timing probe. The effect of the charges is expressed over the captured images due to the plasma dispersion effect.
机译:提出了一种测量EEPROM器件中已编程电荷的方法。通过减去使用激光定时探针捕获的图像来进行电荷的测量。由于等离子弥散效应,电荷的影响在捕获的图像上表达。

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