首页> 外文期刊>IEEE transactions on device and materials reliability >Short Circuit Detection and Fault Current Limiting Method for IGBTs
【24h】

Short Circuit Detection and Fault Current Limiting Method for IGBTs

机译:IGBT的短路检测和故障电流限制方法

获取原文
获取原文并翻译 | 示例
       

摘要

Power devices may become damaged or even fail completely due to over-current caused by external factors such as ac line transients, mechanical overload, misfiring, inverter shoot-through, etc. Some of these incidents can result in a very high current (few times higher than the system's rated current) flow through the electrical drive system. Electrical machines have the capability to withstand very high current for relatively longer time duration (milliseconds to seconds depending on the size of the machine). On comparison, power devices, especially IGBTs, can withstand short-circuit current only for very short time durations in the order of microseconds and prolonged exposure can easily damage the power device. Industrial application requires proper short-circuit fault detection and protection circuits to protect the IGBTs from fault currents. Therefore, this article presents the fault detection circuit is based on monitoring the collector-emitter voltage using external collector capacitor, and the protection circuit is based on softly turning off the gate voltage using a current diode. The proposed method reduces power dissipation, temperature rise and prevents damage of the drive system.
机译:由于外部因素,机械过载,误兵,逆变器拍摄等外部因素导致电流导致电力器件可能会受损或甚至完全失败。这些事件中的一些可能导致电流非常高(几次高于系统的额定电流)流过电动驱动系统。电机具有相对较长的时间持续时间(根据机器尺寸的速度)承受非常高的电流的能力。相比之下,功率器件,尤其是IGBT,可以承受短路电流仅在微秒的顺序和长时间曝光时持续的短路电流可以容易地损坏功率装置。工业应用需要适当的短路故障检测和保护电路,以保护IGBT免受故障电流。因此,本文呈现故障检测电路基于使用外部集电极电容器监控集电极 - 发射极电压,并且保护电路基于使用电流二极管柔软地关闭栅极电压。所提出的方法可降低功耗,温度升高,防止驱动系统的损坏。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号