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机译:基于脉冲收缩的3-D IC中通过硅预键合的测试解决方案
Hefei Univ Technol, Sch Elect Sci & Appl Phys, Hefei 230009, Anhui, Peoples R China;
Hefei Univ Technol, Sch Elect Sci & Appl Phys, Hefei 230009, Anhui, Peoples R China;
Hefei Univ Technol, Sch Elect Sci & Appl Phys, Hefei 230009, Anhui, Peoples R China;
Hefei Univ Technol, Sch Math, Hefei 230009, Anhui, Peoples R China;
Anhui Univ Finance & Econ, Dept Comp Sci & Technol, Bengbu, Peoples R China;
Hefei Univ Technol, Sch Elect Sci & Appl Phys, Hefei 230009, Anhui, Peoples R China;
3-D integrated circuits (3-D ICs); leakage fault; open fault; pulse shrinking; through silicon via (TSV);
机译:通过3-D ICS通过硅通过硅的脉冲收缩的测试解决方案
机译:2.5维IC中硅中介层的预键合测试和测试路径设计
机译:2.5D IC中的非侵入式在线分布式脉冲缩小互连测试
机译:磁共振脉冲场中的硅光电倍增管性能测试
机译:设计,建造和实施用于研究砷化镓和碳化硅光触发开关的高压脉冲功率测试台。
机译:低流量小飞秒激光脉冲诱导等离子体近场消融硅基氧化膜周期纳米结构的制备
机译:通过硅通过硅通过基于时间 - 到数字转换} {Prebond通过硅通过基于时间转换而测试