Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus

摘要

This paper proposes combining the standard histogram method with a stimulus identification algorithm in order to test the integral nonlinearity (INL) of a high-resolution analog-to-digital (A/D) converter without a high-quality sine wave. The major problems in the two techniques are explained in order to appreciate the benefits of the combination. The increased INL estimation accuracy is verified with simulations of 16-b A/D converters under different conditions, and experimental results of the INL testing of a 16-b A/D converter are also quoted to support the theory. The simulations and experimental tests show that the INL of 16-b A/D converters can be measured with very simple equipment and that an accurate test stimulus is not necessary.