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首页> 外文期刊>IEEE transactions on circuits and systems . I , Regular papers >A Transient-Enhanced Output-Capacitorless LDO With Fast Local Loop and Overshoot Detection
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A Transient-Enhanced Output-Capacitorless LDO With Fast Local Loop and Overshoot Detection

机译:具有快速局部环路和过冲检测的瞬态增强输出电容器LDO

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摘要

An output-capacitorless low-dropout regulator (OCL-LDO) with simple structure and fast transient response is proposed for system-on-chip (SoC) applications. A super source follower is inserted into a cascoded flipped voltage follower to drive the power transistor, which forms a fast-local loop for quick turn-on. A robust overshoot detection circuit consuming only leakage current is proposed for fast turn-off. The combination of these two techniques significantly reduce the overshoot/undershoot voltages and achieve fast settling time during load steps. A simple yet effective additional turn-around stage is added in the error amplifier to improve the positive phase slew rate for potential dynamic voltage scaling (DVS) function in battery-operated systems. The LDO is implemented in a 65 nm CMOS process and it can deliver a 20 mA load current with 0.9 V regulated output and 150 mV dropout voltage. It occupies an active area of 0.01 mm2 and can work stably in a load range from 0 to 20 mA with 65 mu A quiescent current. The measured results show a settling time about 100 ns for load steps from 100 mu A to 20 mA as well as V-REF and V-IN steps.
机译:提出了一种具有简单结构和快速瞬态响应的输出电容器低压丢失调节器(OCL-LDO),用于片上系统(SOC)应用。将超源跟随器插入到级联的翻转电压跟随器中以驱动电源晶体管,从而形成快速局部回路以便快速开启。仅提出耗电电流的强大的过冲检测电路,以便快速关闭。这两种技术的组合显着降低了过冲/下冲电压并在负载步骤期间实现快速稳定时间。在误差放大器中添加了一个简单但有效的额外扭转阶段,以提高电池供电系统中的电位动态电压缩放(DVS)功能的正相转换速率。 LDO在65 nm CMOS过程中实现,可提供20 mA负载电流,其中0.9V调节输出和150 mV丢失电压。它占据有效面积为0.01 mm 2,可以在距离0至20 mA的负载范围内稳定地工作,静态电流为65亩。测量结果显示约100ns的沉降时间,从100μA到20 mA以及V-REF和V-in步骤。

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