首页> 外文期刊>IEEE Photonics Technology Letters >Temperature measurements of separate absorption, grading, charge, and multiplication (SAGCM) InP/InGaAs avalanche photodiodes (APD's)
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Temperature measurements of separate absorption, grading, charge, and multiplication (SAGCM) InP/InGaAs avalanche photodiodes (APD's)

机译:分别吸收,分级,电荷和倍增(SAGCM)InP / InGaAs雪崩光电二极管(APD)的温度测量

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摘要

Temperature-dependent measurements were per formed on planar separate absorption, grading, charge, and multiplication (SAGCM) avalanche photodiodes (APD's). The bandwidth versus gain dependence, gain, and breakdown voltage are strongly correlated with the temperature. The gain-bandwidth product and minimum gain for useful bandwidth both increase with decreasing temperature or decreasing breakdown voltage. This is the first report of non-room-temperature performance of these devices.
机译:对平面独立的吸收,分级,电荷和倍增(SAGCM)雪崩光电二极管(APD)进行温度相关的测量。带宽与增益的关系,增益和击穿电压与温度密切相关。增益带宽乘积和有用带宽的最小增益都随温度降低或击穿电压降低而增加。这是这些设备非室温性能的第一份报告。

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