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Multiplication in separate absorption, grading, charge, and multiplication InP-InGaAs avalanche photodiodes

机译:InP-InGaAs雪崩光电二极管在单独的吸收,分级,电荷和倍增中的倍增

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摘要

Planar separate absorption, grading, charge, and multiplication (SAGCM) InP-InGaAs avalanche photodiodes (APD's) are ideal for studying the multiplication (photogain) versus bias voltage (M-V) characteristics. In this paper, the M-V characteristics-in SAGCM InP-InGaAs APD's are investigated both experimentally and theoretically. The self-calibrated nature of M and the bias-voltage independent quantum efficiency make it possible to compare theory and experiment accurately in an InP-based APD. The Miller empirical formula for Si and Ge is proved appropriate for the SAGCM InP-InGaAs APD's. Using a physics-based model, the M-V characteristics and its temperature dependence for all the SAGCM APD's with different device parameters is calculated theoretically, and the calculations are in good agreement to the experimental results.
机译:平面分离吸收,分级,电荷和倍增(SAGCM)InP-InGaAs雪崩光电二极管(APD's)是研究倍增(光增益)与偏置电压(M-V)特性的理想选择。本文通过实验和理论研究了SAGCM InP-InGaAs APD的M-V特性。 M的自校准性质和与偏置电压无关的量子效率,使得在基于InP的APD中精确地比较理论和实验成为可能。事实证明,Si和Ge的Miller经验公式适用于SAGCM InP-InGaAs APD。使用基于物理学的模型,从理论上计算了所有具有不同器件参数的SAGCM APD的M-V特性及其对温度的依赖性,计算结果与实验结果非常吻合。

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