Improved quasi-static spectral domain analysis of microstrip lines on high-conductivity insulator-semiconductor substrates

摘要

An improved quasi-static integral spectral domain analysis (SDA) for multistrips on a layered insulator-semiconductor substrate is proposed. This method of analysis significantly improves previous quasi-static SDA, accounting for the series resistance of the line in addition to the shunt conductance considered in the conventional quasi-TEM SDA. An excellent agreement with the full-wave analysis results is obtained with considerably less computation time.