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首页> 外文期刊>IEEE journal of selected topics in quantum electronics >Characteristics of spectral-hole burning of InAs self-assembled quantum dots
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Characteristics of spectral-hole burning of InAs self-assembled quantum dots

机译:InAs自组装量子点的光谱孔燃烧特性

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Spectral-hole burning of InAs self-assembled quantum dots (QDs) embedded in pin-diode was observed. At 5 K, a narrow hole with width of less than 1 mm was observed and the hole depth increased as electric field increased with the writing light power of 8 mW. The hole was observed up to 40 K. The spectral hole was broadened as the writing light power increases from 8 to 20 mW. Spectral-hole width at the 8 mW was well fitted with the convolution integral of Gaussian distribution for reading light and Lorentzian distribution for absorption change taking into account homogeneous broadening of InAs QDs of /spl les/80 /spl mu/eV. Spectral-hole lifetime at the 8 mW was estimated to be in the order of 10/sup -6/ s. Optical absorption spectrum of 15-stacked InAs QD structure was also observed at 77 K and 300 K.
机译:观察到嵌入在pin二极管中的InAs自组装量子点(QD)的光谱孔燃烧。在5 K下,观察到宽度小于1 mm的狭窄孔,并且随着电场的增加,随着8 mW的写入光功率的增加,孔的深度也随之增加。观察到该孔直到40K。随着写入光功率从8 mW增加到20 mW,光谱孔变宽了。考虑到/ spl les / 80 / spl mu / eV的InAs量子点的均匀展宽,在8 mW的光谱孔宽度与高斯分布的卷积积分(用于读取光)和Lorentzian分布(用于吸收变化)非常吻合。估计8 mW的光谱孔寿命约为10 / sup -6 / s。在77 K和300 K下也观察到15层InAs QD结构的光吸收光谱。

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