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首页> 外文期刊>IEEE journal of selected topics in quantum electronics >Dependence of atomic diffusion in GaAs upon experimental design
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Dependence of atomic diffusion in GaAs upon experimental design

机译:GaAs中原子扩散对实验设计的依赖性

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摘要

The rate of impurity diffusion in GaAs depends upon thenconcentration of point defects such as vacancies and interstitials. Thenconcentration of those point defects is strongly affected by the regionnof the phase diagram corresponding to the chosen experimental design.nDifferent regions of phase diagrams are used to illustrate why nominallynsimilar experiments can lead to dramatically different results. When thenequilibrium point defect concentrations can be approached in a timenwhich is short compared to the anneal time, the measured diffusivitiesntend to be reproducible. However, when the point defect concentrationsnapproach their equilibrium values over times which are long compared tonthe anneal time, the measured diffusivities tend to be irreproduciblenand time dependent. Examples of “anomalous” diffusion arendiscussed and shown to be associated with fundamental differences innexperimental design that tend to bring the point defect concentrationntoward equilibrium in different regions of the phase diagram
机译:GaAs中杂质扩散的速率取决于点缺陷(如空位和间隙)的浓度。然后,这些点缺陷的浓度会受到与所选择的实验设计相对应的相图区域的强烈影响。n相图的不同区域用于说明为什么名义上相似的实验可以导致截然不同的结果。当可以在比退火时间短的时间内达到平衡点缺陷浓度时,测得的扩散率可再现。但是,当点缺陷浓度在与退火时间相比较长的时间内达到其平衡值时,测得的扩散率往往是不可再现的,并且与时间有关。讨论了“异常”扩散的示例,并证明这些示例与实验设计中的基本差异相关,这些基本差异往往会使点缺陷浓度在相图的不同区域内达到平衡

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