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Characterization of semiconductor laser gain media by the segmented contact method

机译:分段接触法表征半导体激光增益介质

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摘要

In this paper, we describe methods for analysis of edge-emitted amplified spontaneous emission spectra measured as a function of the pumped stripe length. We show that both the modal gain and the unamplified spontaneous emission spectra can be extracted from the data, and we describe a means of calibrating the spontaneous emission in real units, without requiring the carrier populations to be described by Fermi functions. The gain and emission spectra can be determined for transverse electric and transverse magnetic polarizations and by summing the recombination currents for each polarization the total radiative current can be measured. This enables the overall internal radiative quantum efficiency to be calculated. Once the calibration factor is known the internal stimulated recombination rate at the facet can also be estimated. The experiment can be configured to give a measurement of the passive modal absorption of the gain medium. The internal optical mode loss can be determined from the long-wavelength region of the gain spectrum or the modal absorption spectrum. In summary, we show that measurements of amplified spontaneous emission spectra provide a full characterization of the gain medium.
机译:在本文中,我们描述了分析边缘发射的自发发射光谱的方法,这些光谱是随泵浦条纹长度而变化的。我们表明,模态增益和未放大的自发发射谱都可以从数据中提取,并且我们描述了一种以实际单位校准自发发射的方法,而无需用费米函数描述载流子。可以确定横向电极化和横向磁极化的增益和发射光谱,并通过求和每种极化的重组电流的总和,可以测量总辐射电流。这使得能够计算整体内部辐射量子效率。一旦知道了校准因子,也可以估算小平面上的内部受激重组率。可以对实验进行配置,以测量增益介质的被动模态吸收。内部光学模式损耗可以从增益谱或模态吸收谱的长波长区域确定。总而言之,我们表明,放大的自发发射光谱的测量提供了增益介质的完整特征。

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