首页> 外文期刊>Quantum Electronics, IEEE Journal of >Design and Analysis of 250-nm AlInN Laser Diodes on AlN Substrates Using Tapered Electron Blocking Layers
【24h】

Design and Analysis of 250-nm AlInN Laser Diodes on AlN Substrates Using Tapered Electron Blocking Layers

机译:使用锥形电子阻挡层在AlN基板上设计和分析250 nm AlInN激光二极管

获取原文
获取原文并翻译 | 示例
       

摘要

A theoretical investigation into the operation of AlInN ultraviolet laser (UV) diodes on AlN substrates is presented. 2-D optoelectronic simulation of a prototypical design predicts lasing at a target wavelength of 250 nm. Simulations indicate optical gain degradation attributable to a parasitic inversion layer, which forms as a result of polarization charge associated with homogeneous electron blocking layers. Appreciable improvement in optical gain is demonstrated in designs featuring inhomogeneous electron blocking layers, by virtue of a volumetric redistribution of polarization charge. Numerical simulations inspire confidence in AlInN as a viable alternative to AlGaN technologies for UV laser-diode operation.
机译:提出了对AlNN衬底上的AlInN紫外激光(UV)二极管的操作的理论研究。原型设计的二维光电模拟可预测目标波长为250 nm的激光发射。模拟表明归因于寄生反转层的光学增益下降,该寄生反转层是由于与均匀电子阻挡层相关的极化电荷而形成的。通过极化电荷的体积重新分布,在具有不均匀电子阻挡层的设计中证明了光学增益的明显改善。数值模拟激发了人们对AlInN的信心,AlInN可以替代AlGaN技术用于UV激光二极管操作。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号