首页> 外文期刊>IEEE Journal of Quantum Electronics >Identification of band-edge optical transition types in tensile strained quantum wells
【24h】

Identification of band-edge optical transition types in tensile strained quantum wells

机译:拉伸应变量子阱中带边光学跃迁类型的识别

获取原文
获取原文并翻译 | 示例
       

摘要

A new characterization technique based on photoluminescence excitation spectroscopy (PLE) which allows simple and direct identification of band-edge transition types in quantum wells is developed. A ratio curve is generated by pointwise division of one PLE spectrum by a second PLE spectrum. The two PLE spectra are obtained using orthogonal polarizations of the excitation beam, which is incident on the sample surface at an oblique angle, and the transition types near the band edge are identified by simple visual inspection of the ratio curve. The authors describe and assess the theoretical foundation for the ratio method, detail the experimental procedure, present PLE spectra and ratio curves for several quantum wells, and determine optimum experimental conditions and the physical origin of features in the ratio curve through investigation of the influence of several experimental parameters.
机译:开发了一种基于光致发光激发光谱(PLE)的新表征技术,该技术可以简单,直接地识别量子阱中的带边跃迁类型。通过将一个PLE频谱按点除以第二个PLE频谱来生成比率曲线。这两个PLE光谱是使用激发光束的正交偏振(以倾斜角入射到样品表面上)获得的,并且通过简单地目视比率曲线可以识别出带边缘附近的跃迁类型。作者描述并评估了配比方法的理论基础,详细了实验程序,给出了几个量子阱的PLE光谱和配比曲线,并通过研究了配比的影响确定了最佳实验条件和配比曲线的物理起源。几个实验参数。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号