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首页> 外文期刊>IEE Proceedings. Part A >Influence of lot arrival distribution on production dispatching rule scheduling and cost in the final test process of LSI manufacturing system
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Influence of lot arrival distribution on production dispatching rule scheduling and cost in the final test process of LSI manufacturing system

机译:LSI制造系统的最终测试过程中,批量到达分配对生产调度规则计划和成本的影响

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Seven production dispatching rules in the real final test process of one-chip microcomputers are evaluated through an event- driven simulation analysis with regard to the total number of processed lots, the number of tardy lots, the average turnaround time (TAT) and the cost per chip. Several lot arrival distributions during one month are assumed to simulate the fact that the arrival lots tend to increase toward the end of the month but drop near the beginning of the next month. Simulated results for six months show that the rule which considers the time required for jig exchange. the time required for temperature change. the lot waiting time in queue and also the remaining processing time of the machine in use is superior to others. The rule processes about 99/100 of the planned number of lots and the ratio of tardy lots to processed lots is less than 1/100, even when the deviation of lot arrival distribution with respect to the uniform distribution changes from 0/100 to 50/100. The average test TAT and the test cost per chip are about 5/100 and 70/100 with respect to those for the well-known first-in first-out (FIFO) rule.
机译:通过事件驱动的仿真分析,评估了在单片机实际最终测试过程中的七个生产调度规则,涉及处理的批次总数,迟到的批次数,平均周转时间(TAT)和成本每个芯片。假设一个月内有多个批次到达分布,以模拟以下事实:到达批次趋向于在月末增加,但在下个月开始时下降。六个月的模拟结果表明,该规则考虑了夹具更换所需的时间。温度变化所需的时间。排队等待的时间以及所用机器的剩余处理时间均优于其他机器。该规则处理计划批次的约99/100,并且即使批次到达相对于均匀分布的偏差从0/100变为50,迟到批次与已处理批次的比率也小于1/100。 / 100。相对于众所周知的先进先出(FIFO)规则,每个芯片的平均测试TAT和测试成本约为5/100和70/100。

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