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An Analysis of Diffusion in Semiconductors

机译:半导体扩散分析

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In the experimental determinations of the coefficients of diffusion of impurities in semiconductors reported to date, it has usually been assumed that these coefficients do not vary with concentration. This assumption is questioned here. Interactions between acceptors, donors, electrons, and holes may lead to complicated diffusion equations, as shown by an analysis based on Onsager's theory. In particular, appreciable covalent compound formation is likely to occur between some substitutional donors and acceptors. This alone may lead to a marked dependence of diffusion coefficients on concentration, and to diffusion of acceptors induced by concentration gradients of donors and vice versa. Such effects are suggested by some discrepancies in the experimental results reported thus far.
机译:在迄今报道的半导体中杂质扩散系数的实验确定中,通常假定这些系数不随浓度而变化。这个假设在这里受到质疑。接受者,施主,电子和空穴之间的相互作用可能会导致复杂的扩散方程,这是根据基于昂萨格理论的分析得出的。特别地,在某些取代供体和受体之间可能发生明显的共价化合物形成。仅此本身就可能导致扩散系数对浓度的显着依赖性,并导致由供体的浓度梯度引起的受体扩散,反之亦然。迄今为止报道的实验结果中的一些差异表明了这种效果。

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    《IBM Journal of Research and Development》 |1957年第1期|P.57-61|共5页
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  • 入库时间 2022-08-17 13:28:33

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