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Tritium depth profile in matter using an imaging plate

机译:使用成像板的物质中depth深度分布

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A method to detect tritium non-destructively in regions deeper than the escape depth of beta rays is being developed using bremsstrahlung induced by beta rays with an imaging plate (IP). An IP made of europium-doped BaFBr(I), a photostimulated luminescence (PSL) material, is a two-dimensional radiation sensor. The bremsstrahlung energy spectrum is a continuum with photon energies, varying based on the atomic number and thickness of the target (or absorbing) material. When tritium migrates into matter, the bremsstrahlung energy spectrum distribution would change. The PSL intensity of the IP is affected by this energy spectrum variation. In order to quantify the amount of tritium in deeper regions with the IP technique, a tritium depth profile is required. In this study, a new method of obtaining a tritium depth profileusing the combined technique of the IP and thin absorbers is presented.
机译:正在开发一种方法,该方法通过使用由β射线通过成像板(IP)诱导的致辐射,开发了一种比β射线的逸出深度更深的区域中的非破坏性detect检测方法。由of掺杂的BaFBr(I)(一种光刺激发光(PSL)材料)制成的IP是二维辐射传感器。致辐射能谱是具有光子能量的连续谱,它根据目标(或吸收)材料的原子序数和厚度而变化。当tri迁移到物质中时,the致辐射能谱分布将发生变化。 IP的PSL强度受此能谱变化的影响。为了用IP技术量化更深区域中的tri含量,需要a深度分布图。在这项研究中,提出了一种使用IP和薄吸收体的组合技术获得obtaining深度分布的新方法。

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