System level test enables a paradigm shift for device manufacturers

摘要

FAULTS COVERAGE is becoming more problematic as systems are getting more complex, heterogeneous and applications are more demanding. Applications such as self-driving cars, cloud servers, Al, industrial IOT or medical devices are now mission critical to many end use sectors, driving the need for low parts per billion (PPB) defect levels. Semiconductors continue to follow Moore's Law regarding the doubling of transistors at every process node. While these leaps occurred previously in 18-24 month periods, the complexity of advanced nodes has made progress more challenging and time between nodes greater. As these new process nodes come to market, higher numbers of smaller transistors will make it more difficult to catch defects, and will make test coverage more demanding.