Model-based, multiple-fault diagnosis of dynamic, continuous physical devices

摘要

A diagnosis algorithm called Inc-Diagnose that can generate diagnosis candidates incrementally and detect multiple faults is presented. It models continuously changing device states using a discrete set of Qsim qualitative states over time. Inc-Diagnose is a modification of R. Reiter's algorithm (Artif. Intell., vol.32., no.1, p.57-95, 1987), the theory of which is reviewed. An example diagnosis is given.