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首页> 外文期刊>IEEE Transactions on Electrical Insulation >Optimization of test procedure to improve insulator performance under high electric stress
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Optimization of test procedure to improve insulator performance under high electric stress

机译:优化测试程序以提高高电应力下的绝缘子性能

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摘要

Surface flashover properties in relation to test procedures were investigated, using single-cycle steady step, multiple-cycle steady-step, multiple-shot, and hill-valley tests. In general, the test procedures were found to influence significantly the surface flashover properties of large-bandgap insulators such as polycrystalline alumina and signal-crystal quartz in vacuum. The steady-step tests increased the degree of conditioning to a higher level during the second day. However, the samples subjected to these tests displayed a higher degree of deconditioning during the second and third day. A simultaneous increase of conditioning and decrease of deconditioning was observed for the multiple-shot and hill-valley tests. The surface flashover performances of 6- mu m-finish alumina specimens for different test procedures are also compared and discussed. The behavior of the insulators under a given test procedure is explained on the basis of surface electronic defects and adsorbed gaseous atoms or molecules.
机译:使用单周期稳定步长,多周期稳定步长,多次发射和希尔谷测试研究了与测试程序相关的表面闪络特性。通常,发现测试程序会显着影响大带隙绝缘子(如多晶氧化铝和信号晶体石英)在真空中的表面闪络特性。稳态测试将第二天的调节程度提高到更高的水平。但是,经过这些测试的样品在第二天和第三天显示出更高的脱盐度。对于多次射击和丘陵谷地试验,观察到条件调节同时增加和条件降低减少。还比较和讨论了6微米间抛光氧化铝样品在不同测试程序下的表面闪络性能。根据表面电子缺陷和吸附的气态原子或分子,说明了绝缘子在给定测试程序下的行为。

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