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首页> 外文期刊>Electronics Letters >Amorphous carbon/crystalline silicon high voltage heterojunction diode prepared by photochemical vapour deposition
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Amorphous carbon/crystalline silicon high voltage heterojunction diode prepared by photochemical vapour deposition

机译:光化学气相沉积制备非晶碳/晶体硅高压异质结二极管

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摘要

A high reverse breakdown voltage hydrogenated amorphous carbon (a-C:H)/crystalline silicon (c-Si) heterojunction diode has been successfully prepared by the photochemical vapour deposition (photo-CVD) method. This method has the advantage of being free from RF radiation. There is a lower density of fixed charges at the Al/a-C:H interface and in the bulk of a-C:H film. Hence the photo-CVD a-C:H/c-Si heterojunction diode shows smaller voltage offset in forward bias and breakdown voltage shrinkage in reverse bias compared to those deposited by plasma enhanced-CVD (PECVD).
机译:通过光化学气相沉积(photo-CVD)方法已经成功地制备了高反向击穿电压的氢化非晶碳(a-C:H)/晶体硅(c-Si)异质结二极管。该方法的优点是没有RF辐射。在Al / a-C:H界面和大部分a-C:H薄膜中,固定电荷的密度较低。因此,与通过等离子体增强CVD(PECVD)沉积的a-C:H / c-Si异质结二极管相比,光CVD a-C:H / c-Si异质结二极管的正向偏置电压偏移较小,反向偏置的击穿电压减小。

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