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Low-voltage bandgap reference with output-regulated current mirror in 90 nm CMOS

机译:具有90 nm CMOS输出调节电流镜的低压带隙基准

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摘要

A low-voltage bandgap reference (BGR) circuit is designed and fabricated in a 90 nm CMOS technology. To mitigate error resulting from the mismatch in temperature dependency of the current in the output current mirror device and that of the BGR core, an output-regulated current mirror is incorporated. Experimental results show that the output voltage is 497.2 mV at 25℃ with a temperature coefficient of 28.3 ppm/℃ between -40℃ and 80℃. The circuit occupies 0.0337 mm~2 and dissipates 276.6 pW with a supply voltage of 1.2 V.
机译:低压带隙基准(BGR)电路是采用90 nm CMOS技术设计和制造的。为了减轻由于输出电流镜器件和BGR内核的电流在温度依赖性方面的不匹配而导致的误差,内置了输出调节的电流镜。实验结果表明,在25℃时输出电压为497.2 mV,温度系数在-40℃至80℃之间为28.3 ppm /℃。该电路占用0.0337 mm〜2的功率,耗散276.6 pW,电源电压为1.2V。

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  • 来源
    《Electronicsletters》 |2010年第14期|P.976-977|共2页
  • 作者

    S. Lee; H. Lee; J.-K. Woo; S. Kim;

  • 作者单位

    Electrical Engineering, Seoul National University, Seoul 151-744, Republic of Korea;

    rnElectrical Engineering, Seoul National University, Seoul 151-744, Republic of Korea;

    rnElectrical Engineering, Seoul National University, Seoul 151-744, Republic of Korea;

    rnElectrical Engineering, Seoul National University, Seoul 151-744, Republic of Korea;

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