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A Novel Bit-Line Direct-Sense Circuit that Uses a Feedback System for High-Speed Flash Memory

机译:一种新型反馈反馈系统用于高速闪存的位线直接检测电路

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摘要

In this paper, a novel bit-line direct-sense circuit is proposed in order to realize high-speed Flash memory. The sense circuit proposed in this paper controls the drivability of the bit-line charging transistor by means of a feedback technique. In this way, it becomes possible to charge the bit-line at high speed so that high-speed readout becomes possible. In spite of complexity in the circuit configuration, the increase of the chip area size is so small as to be negligible. The possibilities of oscillation in the feedback system are analyzed. It is demonstrated that the proposed sense circuit is stable. Hence, the proposed sense circuit can realize high-speed stable readout of Flash memory.
机译:本文提出了一种新型的位线直接检测电路,以实现高速闪存。本文提出的检测电路通过反馈技术控制位线充电晶体管的可驱动性。以此方式,可以对位线进行高速充电,从而可以进行高速读出。尽管电路结构很复杂,但是芯片面积的增加很小,可以忽略不计。分析了反馈系统中振荡的可能性。证明了所提出的感测电路是稳定的。因此,所提出的感测电路可以实现闪存的高速稳定读出。

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