Electromagnetic Analysis for Immunity of Electric Unit Caused by Radiated Electromagnetic Noise

摘要

The immunity of an electronic device to radiated electromagnetic noise, which is determined by the test methods in IEC61000-4-3, has become an important concern. In this paper, the author links an electromagnetic field analysis that takes the impedance characteri sties of an ASIC into consideration and an immunity evaluation technique for a standalone ASIC to investigate the immunity of an electronic device to radiated electromagnetic noise. He verified the validity of the results that were obtained by this analytical technique by comparing them with the results of actual measurements performed in accordance with IEC61000-4-3. He also showed that although the immunity characteristics of an electronic device worsen at the resonance frequency, they can be improved by inserting capacitors.