Using embedded test for SerDes transceivers

摘要

Serializer/deserializer (SerDes) transceivers are implemented in ICs today to support the latest high-speed serial interface standards. Mainstream data rates for SerDes range from 2.5 to over 10 Gbits/s. Performing characterization and manufacturing test on these transceivers typically requires expensive automatic test equipment (ATE) and a lot of time. However, using embedded test for SerDes enables any desktop test system or ATE to quickly test and verify these transceivers.