Cadence aims diagnostics suite at yield engineers

摘要

Santa Cruz, Calif. — Bringing its tools to a new group of users, Cadence Design Systems Inc. has introduced Encounter Diagnostics, a set of yield diagnostics tools for IC process and yield engineers. The offering speeds yield ramp-up time for nanometer-scale IC designs, Cadence said. Although design and test engineers may use of the tool's diagnostics features in the initial phases of silicon debug, Encounter Diagnostics will mainly be used within IC manufacturing groups. It thus opens a new audience for Cadence, which has heretofore focused on IC design tools.