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首页> 外文期刊>Electron Devices Society, IEE >Instantaneous Receiver Operating Characteristic (ROC) Performance of Multi-Gain-Stage APD Photoreceivers
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Instantaneous Receiver Operating Characteristic (ROC) Performance of Multi-Gain-Stage APD Photoreceivers

机译:多增益APD光电接收器的瞬时接收器工作特性(ROC)性能

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摘要

We describe the use of analytical and numerical models of a multi-gain-stage single-carrier multiplication (SCM) avalanche photodiode (APD) to generate time-resolved receiver operating-characteristic (ROC) curves. First, pseudo-DC analytic models of discrete multi-stage APDs are used to generate the statistical properties of the SCM APD necessary for ROC analysis. Next, numerical models are used to develop the joint probability density function (PDF) of the SCM APD gain and avalanche buildup time as a function of the device structure, material properties and local electric fields. The instantaneous (time-resolved) carrier count distributions resulting from photon- and dark-initiated impact ionization chains are used to calculate the mean and variance of the currents induced in the circuits of the photoreceiver over the integration times of the detection event. Last, autocorrelation functions are generated to allow the parameters of the signal, the noise and the signal embedded in noise—which are necessary for ROC hypothesis testing—to be calculated for the instances of the impulse response. It is shown that time-resolved ROC analysis of an APD photoreceiver, which includes the instantaneous properties of photon- and dark-initiated avalanche events, allows for better optimization of photoreceiver performance than does non-time-resolved ROC analysis.
机译:我们描述了使用多增益级单载波乘法(SCM)雪崩光电二极管(APD)的解析模型和数值模型来生成时间分辨的接收器工作特性(ROC)曲线。首先,使用离散多级APD的伪DC分析模型来生成ROC分析所需的SCM APD的统计属性。接下来,使用数值模型来开发SCM APD增益和雪崩累积时间的联合概率密度函数(PDF),该函数与器件结构,材料特性和局部电场有关。由光子和黑暗引发的碰撞电离链产生的瞬时(时间分辨)载流子计数分布用于计算在检测事件积分时间内光电接收器电路中感应电流的平均值和方差。最后,生成自相关函数以允许为冲激响应实例计算信号,噪声和嵌入噪声中的参数(这是ROC假设测试所必需的)。结果表明,APD光接收器的时间分辨ROC分析(包括光子触发和黑暗引发的雪崩事件的瞬时特性)比非时间分辨的ROC分析能够更好地优化光接收器性能。

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