An automated system for measurement of random telegraph noise in metal-oxide-semiconductor field-effect transistors

摘要

A computer-controlled system for measuring the random telegraph noise in small-area MOSFETs is described. The key element is a specially designed current amplifier that employs a feedback technique to separate the fluctuating and DC parts of the drain current. Techniques for automatic extraction of the fluctuation amplitude and time constants from the raw data are also discussed.