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Performance of modulation-doped charge-coupled devices (MD-CCD's) in the microwave and millimeter-wave bands

机译:微波和毫米波波段中调制掺杂的电荷耦合器件(MD-CCD)的性能

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A two-phase, modulation-doped charge coupled device (MD-CCD) has been characterized by both phase shift and charge transfer efficiency (CTE) measurements from 1.25 MHz to 16.4 GHz. Both two-dimensional transient simulations and experimental evidence support the conclusion that the cutoff frequency for transport of discrete charge packets emulates the cutoff frequency of small signal HEMT devices in the short gate length regime. These simulations predict a CTE of almost 0.999 at 40 GHz for an In/sub 0.53/Ga/sub 0.47/As channel device. The device is fabricated using conventional MMIC processing techniques. In addition, measurement methods used for characterization of a prototype 5-stage delay line chip agree well with simulations using a new CCD SPICE model.
机译:两相调制掺杂电荷耦合器件(MD-CCD)的特征是从1.25 MHz至16.4 GHz的相移和电荷转移效率(CTE)测量。二维瞬态仿真和实验证据均支持以下结论:在短栅极长度状态下,离散电荷包传输的截止频率模拟小信号HEMT器件的截止频率。这些模拟预测In / sub 0.53 / Ga / sub 0.47 / As通道设备在40 GHz下的CTE几乎为0.999。该设备使用常规的MMIC处理技术制造。此外,用于表征原型5级延迟线芯片的测量方法与使用新型CCD SPICE模型进行的仿真非常吻合。

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