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首页> 外文期刊>Electron Devices, IEEE Transactions on >Explicit Model of Channel Charge, Backscattering, and Mobility for Graphene FET in Quasi-Ballistic Regime
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Explicit Model of Channel Charge, Backscattering, and Mobility for Graphene FET in Quasi-Ballistic Regime

机译:准弹道状态下石墨烯FET的沟道电荷,背向散射和迁移率的显式模型

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摘要

Ballistic (collision free) and drift-diffusive (collision dominated) transport mechanisms are both present in graphene, and they together contribute in the current conduction in a graphene FET (GFET). In this paper, we propose an analytical drain current model based on ballistic (${n}_{B}$) and drift-diffusive (${n}_{D}$) charge densities, backscattering coefficient (${R}$), and quasi-ballistic mobility ($mu _{ext {eff}}$).${n}_{B}$is calculated using the McKelvey flux theory and${n}_{D}$using the surface potential approach. A closed-form analytical expression is derived for the backscattering coefficient, which is valid under both low and high electric field conditions. The effective quasi-ballistic mobility is obtained by considering both scattering-dominated and scattering free mobilities. The proposed model is well aligned with experimental data, in all regions of operation, for single- and double-gate GFETs.
机译:弹道(无碰撞)和漂移扩散(以碰撞为主)传输机制都存在于石墨烯中,它们共同作用于石墨烯FET(GFET)中的电流传导。在本文中,我们提出了一种基于弹道分析的漏极电流模型( n $ {n} _ {B} $ n)和漂移扩散型( n <在线公式xmlns:mml = “ http://www.w3.org/1998/Math/MathML ” xmlns:xlink = “ http://www.w3。 org / 1999 / xlink “> $ {n} _ {D} $ n)电荷密度,反向散射系数( n $ {R} $ n)和准弹道移动性( n $ mu _ { t​​ext {eff}} $ n)。 n $ {n} _ {B} $ nis使用McKelvey通量理论和 n $ {n} _ {D} $ (使用表面电势方法)。推导了反向散射系数的封闭形式的解析表达式,该表达式在低电场和高电场条件下均有效。有效的准弹道迁移率是通过考虑以散射为主的迁移率和没有散射的迁移率来获得的。对于单栅和双栅GFET,所提出的模型在所有操作区域中均与实验数据完全吻合。

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