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首页> 外文期刊>IEEE Electron Device Letters >Ultra-high-speed digital circuit performance in 0.2- mu m gate-length AlInAs/GaInAs HEMT technology
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Ultra-high-speed digital circuit performance in 0.2- mu m gate-length AlInAs/GaInAs HEMT technology

机译:栅长为0.2μm的AlInAs / GaInAs HEMT技术的超高速数字电路性能

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The fabrication of fifteen-stage ring oscillators and static flip-flop frequency dividers with 0.2- mu m gate-length AlInAs/GaInAs HEMT technology is described. The fabricated HEMT devices within the circuits demonstrated a g/sub m/ transconductance of 750 mS/mm and a full-channel current of 850 mA/mm. The measured cutoff frequency of the device is 120 GHz. The shortest gate delay measured for buffered-FET-logic (BFL) ring oscillators at 300 K was 9.3 ps at 66.7 mW/gate (fan-out=1); fan-out sensitivity was 1.5 ps per fanout. The shortest gate delay measured for capacitively enhanced logic (CEL) ring oscillators at 300 K was 6.0 ps at 23.8 mW/gate (fan-out=1) with a fan-out sensitivity of 2.7 ps per fan-out. The CEL gate delay reduced to less than 5.0 ps with 11.35-mW power dissipation when measured at 77 K. The highest operating frequency for the static dividers was 26.7 GHz at 73.1 mW and 300 K.
机译:描述了采用0.2微米栅极长度的AlInAs / GaInAs HEMT技术制造的十五级环形振荡器和静态触发器分频器。电路中制造的HEMT器件表现出750 mS / mm的g / sub m /跨导和850 mA / mm的全通道电流。测得的设备截止频率为120 GHz。在300 K下,对于缓冲FET逻辑(BFL)环形振荡器测得的最短栅极延迟为66.7 mW / gate(扇出= 1)时的9.3 ps。扇出灵敏度为每个扇出1.5 ps。在300 K下,电容增强逻辑(CEL)环形振荡器测得的最短栅极延迟为23.8 mW /栅极(扇出= 1)时为6.0 ps,扇出灵敏度为每个扇出2.7 ps。在77 K下测量时,CEL栅极延迟降低至小于5.0 ps,功耗为11.35 mW。静态分频器的最高工作频率为76.7 mW和300 K时为26.7 GHz。

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