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首页> 外文期刊>IEEE Electron Device Letters >A novel InGaP/InGaAs/GaAs double /spl delta/-doped pHEMT with camel-like gate structure
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A novel InGaP/InGaAs/GaAs double /spl delta/-doped pHEMT with camel-like gate structure

机译:具有骆驼状栅极结构的新型InGaP / InGaAs / GaAs双/ splδ/掺杂pHEMT

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摘要

The author reports a novel InGaP/InGaAs/GaAs double delta-doped pseudomorphic high-electron mobility transistor (pHEMT) with n/sup +/-GaAs/p/sup +/-InGaP-InGaP camel-like gate structure grown by MOCVD. Due to the p-n depletion from the p/sup +/-InGaP gate to the channel region and the presence of /spl Delta/Ec at the InGaP/InGaAs heterostructure, the turn-on voltage of gate is larger than 1.7 V. For a 1/spl times/100-/spl mu/m/sup 2/ device, the experimental results show an extrinsic transconductance of 107 mS/mm and a saturation current density of 850 mA/mm. Significantly, an extremely broad gate voltage swing larger than 6 V with above 80% maximum g/sub m/ is obtained. Furthermore, the unit current cut-off frequency f/sub T/ and maximum oscillation frequency are up to 20 and 32 GHz, respectively. The excellent device performance provides a promise for linear and large signal amplifiers and high-frequency circuit applications.
机译:作者报告了一种新颖的InGaP / InGaAs / GaAs双delta掺杂的伪非晶高电子迁移率晶体管(pHEMT),具有通过生长的n / sup +/- GaAs / p / sup +/- InGaP / n-InGaGa骆驼状栅极结构MOCVD。由于从p / sup +/- InGaP栅极到沟道区域的pn耗尽以及InGaP / InGaAs异质结构处存在/ spl Delta / Ec,栅极的导通电压大于1.7V。 1 / spl乘以/ 100- / spl的mu / m / sup 2 /器件,实验结果表明,本征跨导为107 mS / mm,饱和电流密度为850 mA / mm。值得注意的是,获得了一个非常宽的栅极电压摆幅,该摆幅大于6 V,最大g / sub m /大于80%。此外,单位电流截止频率f / sub T /和最大振荡频率分别高达20 GHz和32 GHz。出色的器件性能为线性和大型信号放大器以及高频电路应用提供了希望。

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