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Fully Room-Temperature-Fabricated Low-Voltage Operating Pentacene-Based Organic Field-Effect Transistors With HfON Gate Insulator

机译:具有HfON栅极绝缘体的全室温低温低压并五苯工作有机场效应晶体管

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摘要

Low-voltage operating pentacene-based organic field-effect transistors (OFETs) with a HfON gate insulator have been fabricated with a fully room-temperature process. Despite its thin capacitance equivalent thickness of 3.3 nm, the room-temperature-processed HfON gate insulator shows a low leakage current density of $hbox{7} times hbox{10}^{-7} hbox{A/cm}^{2}$ at a gate voltage of $-$2 V. Moreover, the fully room-temperature-fabricated OFET (channel $W/L = hbox{1650/100} muhbox{m}$ ) shows a low subthreshold swing of 0.12 V/decade, a large on/off-current ratio of $hbox{6.8} times hbox{10}^{4}$, a threshold voltage of $-$0.5 V, and a hole mobility of 0.25 $hbox{cm}^{2}/hbox{V}cdothbox{s}$ at an operating voltage of $-$2 V.
机译:具有HfON栅极绝缘体的低压工作并五苯基有机场效应晶体管(OFET)已通过全室温工艺制造。尽管经过室温处理的HfON栅极绝缘体的薄电容等效厚度为3.3 nm,但泄漏电流密度仅为$ hbox {7}乘以hbox {10} ^ {-7} hbox {A / cm} ^ {2 } $在$-$ 2 V的栅极电压下。此外,在室温下完全制成的OFET(通道$ W / L = hbox {1650/100} muhbox {m} $)显示了0.12 V /的低亚阈值摆幅。十年,开/关电流比率为$ hbox {6.8}乘以hbox {10} ^ {4} $,阈值电压为$-$ 0.5 V,空穴迁移率为0.25 $ hbox {cm} ^ {2 } / hbox {V} cdboxbox {s} $,工作电压为$-$ 2V。

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