首页> 外文期刊>Electron Device Letters, IEEE >Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms
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Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms

机译:通过使用程序算法减少基于Hf1-xAlxOy的RRAM阵列中的单元间差异

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摘要

In this letter, we propose an effective route to reduce the cell-to-cell variability in 1T-1R-based random access memories (RRAM) arrays by combining the excellent switching performance of Hf1-xAlxOy with an optimized incremental step pulse with verify algorithm for programming. The strongly reduced cell-to-cell variability improves the thermal and post-programming stability of the arrays, which is relevant for many applications of the RRAM technology. Finally, the retention study at 150 °C enables the prediction of the data storage capability.
机译:在这封信中,我们提出了一条有效的途径,通过将Hf1-xAlxOy的出色开关性能与优化的增量步进脉冲与验证算法相结合,来减少基于1T-1R的随机存取存储器(RRAM)阵列中的单元间差异。用于编程。大大降低的单元间可变性提高了阵列的热稳定性和编程后稳定性,这与RRAM技术的许多应用有关。最后,在150°C下的保留时间研究可以预测数据存储能力。

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