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首页> 外文期刊>IEEE Electron Device Letters >A Novel Micro-Multifocus X-Ray Source Based on Electron Beam Scanning for Multi-View Stationary Micro Computed Tomography
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A Novel Micro-Multifocus X-Ray Source Based on Electron Beam Scanning for Multi-View Stationary Micro Computed Tomography

机译:基于电子束扫描的新型微型多孔X射线源,用于多视图静止微型计算机断层扫描

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摘要

We developed a new prototype micro-multifocus X-ray source based on electron beam scanning (MMFEBS) for multi-view stationary Micro Computed Tomography (multi-view stationary Micro-CT). This micro-multifocus X-ray source includes an electron gun, electron beam deflection coils, a dynamic condensor, a flat panel transmission target and dynamic vacuum system. The electron beam is controlled by the deflection coils and sweeps back and forth on the flat panel transmission target. It hits a series of accurately-defined positions on the target, resulting in two-dimensional X-ray multi-focus array. A dynamic condensor is utilized to overcome the electron beam defocusing caused by the deflection. It guarantees the same high spatial resolution (better than 4 mu m) at any deflection angle. The MMFEBS, together with a rotational stage and a flat panel detector, produces a multi-view stationary Micro-CT which can obtain multi-view X-ray projection data for CT images in static condition. Micron resolution CT images obtained in our experiments showed that the MMFEBS has high resolution and good repeatability.
机译:我们开发了一种基于电子束扫描(MMFEBS)的新型原型微型多焦点X射线源,用于多视图静止微计算机断层扫描(多视图静止微型CT)。该微孔X射线源包括电子枪,电子束偏转线圈,动态电容,平板传输目标和动态真空系统。电子束由偏转线圈控制并在平板传输目标上来回扫掠。它击中目标上的一系列精确定义的位置,从而导致二维X射线多焦阵列。使用动态电容来克服由偏转引起的电子束散焦。它保证在任何偏转角度相同的高空间分辨率(优于4 mu m)。 MMFEB与旋转级和平板检测器一起产生多视图静止微型CT,其可以在静态条件下获得用于CT图像的多视图X射线投影数据。在我们的实验中获得的微米分辨率CT图像表明,MMFEB具有高分辨率和良好的重复性。

著录项

  • 来源
    《IEEE Electron Device Letters》 |2020年第1期|167-170|共4页
  • 作者单位

    Chongqing Univ Key Lab Optoelect Technol & Syst Educ Minist China Chongqing 400044 Peoples R China|Chongqing Univ Engn Res Ctr Ind Comp Tomog Nondestruct Testing Educ Minist China Chongqing 400044 Peoples R China;

    Chongqing Univ Key Lab Optoelect Technol & Syst Educ Minist China Chongqing 400044 Peoples R China|Chongqing Univ Engn Res Ctr Ind Comp Tomog Nondestruct Testing Educ Minist China Chongqing 400044 Peoples R China;

    Chongqing Univ Key Lab Optoelect Technol & Syst Educ Minist China Chongqing 400044 Peoples R China|Chongqing Univ Engn Res Ctr Ind Comp Tomog Nondestruct Testing Educ Minist China Chongqing 400044 Peoples R China;

    Chongqing Univ Key Lab Optoelect Technol & Syst Educ Minist China Chongqing 400044 Peoples R China|Chongqing Univ Engn Res Ctr Ind Comp Tomog Nondestruct Testing Educ Minist China Chongqing 400044 Peoples R China;

    Chongqing Univ Key Lab Optoelect Technol & Syst Educ Minist China Chongqing 400044 Peoples R China|Chongqing Univ Engn Res Ctr Ind Comp Tomog Nondestruct Testing Educ Minist China Chongqing 400044 Peoples R China;

    Chongqing Univ Key Lab Optoelect Technol & Syst Educ Minist China Chongqing 400044 Peoples R China|Chongqing Univ Engn Res Ctr Ind Comp Tomog Nondestruct Testing Educ Minist China Chongqing 400044 Peoples R China;

    Chongqing Univ Key Lab Optoelect Technol & Syst Educ Minist China Chongqing 400044 Peoples R China|Chongqing Univ Engn Res Ctr Ind Comp Tomog Nondestruct Testing Educ Minist China Chongqing 400044 Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    X-ray source; micro-focus; computed tomography; electromagnetic forces;

    机译:X射线源;微焦点;计算断层扫描;电磁力;

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