A new lightning surge test circuit for telecommunications equipment in Japan

摘要

The development of a lightning surge test circuit that can predict malfunctions in telecommunications equipment is reported. The test circuit was developed using the equivalent impedance of telecommunication line and a voltage source that generates the test surge. The test surge waveform is determined from observed lightning surge data in Japan based on the equipment malfunction rate. In experiments using a key telephone switching system, the malfunction rates predicted by the test are shown to agree closely with observed rates.