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首页> 外文期刊>Electromagnetic Compatibility, IEEE Transactions on >Experimental Demonstration of Electromagnetic Information Leakage From Modern Processor-Memory Systems
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Experimental Demonstration of Electromagnetic Information Leakage From Modern Processor-Memory Systems

机译:来自现代处理器-存储系统的电磁信息泄漏的实验演示

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This paper shows that electromagnetic (EM) information leakage from modern laptops and desktops (with no peripherals attached) is indeed possible and is relatively easy to achieve. The experiments are performed on three laptop systems and one desktop system with different processors (Intel Centrino, Core 2, Core i7, and AMD Turion), and show that both active (program deliberately tries to cause emanations at a particular frequency) and passive (emanations at different frequencies happen as a result of system activity) EM side-channel attacks are possible on all the systems we tested. Furthermore, this paper shows that EM information leakage can reliably be received at distances that vary from tens of centimeters to several meters including the signals that have propagated through cubicle or structural walls. Finally, this paper shows how activity levels and data values used in accessing different parts of the memory subsystem (off-chip memory and each level of on-chip caches) affect the transmission distance.
机译:本文表明,现代笔记本电脑和台式机(未连接外围设备)的电磁(EM)信息泄漏确实是可能的,并且相对容易实现。实验是在三种笔记本电脑系统和一个具有不同处理器(英特尔迅驰,酷睿2,酷睿i7和AMD Turion)的台式机系统上进行的,结果表明主动(程序故意尝试以特定频率发出信号)和被动(程序)系统活动会导致不同频率的发射。)在我们测试的所有系统上,EM侧通道攻击都是可能的。此外,本文表明,在从几十厘米到几米不等的距离内,包括通过小隔间或结构墙传播的信号,可以可靠地接收到EM信息泄漏。最后,本文显示了访问存储器子系统的不同部分(片外存储器和片上缓存的每个级别)所使用的活动级别和数据值如何影响传输距离。

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