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Logic analyzers and deep-memory scopes learn to march in lock step

机译:逻辑分析仪和深度内存示波器学习步步为营

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摘要

Logic analyzers and oscilloscopes sit side by side on the digital designer's workbench. Even so, during design and debug, the two instruments usually function independently―except when designers need to correlate anomalies in digital data with the signals' analog characteristics. Unfortunately, using the two instruments in a well-correlated fashion has been difficult, imprecise, and time-consuming. Cross-instrument measurements, have been hampered by a lack of tools for quickly and accurately deskewing or time-aligning traces and by the absence of sufficient memory depth in all but the most expensive scopes. Fortunately, recent advances in both scope memory depth and in automated deskew have opened the door to quick and accurate time-correlated measurements.
机译:逻辑分析仪和示波器并排放置在数字设计师的工作台上。即使这样,在设计和调试期间,这两种仪器通常也可以独立运行,除非设计人员需要将数字数据中的异常与信号的模拟特性相关联。不幸的是,以良好相关的方式使用这两种仪器一直是困难,不精确且耗时的。跨仪器测量由于缺少用于快速,准确地进行偏移校正或时间对齐的迹线的工具以及除最昂贵的示波器外的所有存储器深度不足而受阻。幸运的是,示波器存储深度和自动校正时间方面的最新进展为快速,准确地与时间相关的测量打开了大门。

著录项

  • 来源
    《Electrical Design News》 |2002年第7期|p.69-7072|共3页
  • 作者

    Dave Sontae;

  • 作者单位

    Aeilent Technologies in Colorado Springs, CO;

  • 收录信息 美国《科学引文索引》(SCI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 一般性问题;
  • 关键词

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