Extensions to the IEEE 1149.1 boundary-scan standard

摘要

The IEEE 1149.1 boundary-scan standard, developed almost 15 years ago, gears up for new challenges in the test industry. The IEEE 1149.1 boundary-scan standard was developed almost 15 years ago to resolve the problems associated with limited physical access for probing test points on printed circuit boards (PCBs), to verify that device pins have been soldered correctly and are free of solder shorts and open circuits.