首页>
外国专利>
Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests
Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests
展开▼
机译:实现对边界扫描设计和测试符合IEEE标准1149.1的机制
展开▼
页面导航
摘要
著录项
相似文献
摘要
A mechanism for enabling compliance with the IEEE boundary-scan standard 1149.1 includes, in a first preferred embodiment, a compliance enabler working with non-compliant embedded boundary-scan cells to enable a Device Under Test (DUT) to function as an IEEE-standard-compliant part, thus allowing full utilization of existing test tool generation and operation of the IEEE standard. The enabler is preferably provided separately from boundary scan-cells embedded in core logic designs. The enabler includes a Test Access Port (TAP) controller and related decoding circuits to generate necessary compliance signals based on various conventional TAP controller variables and instruction functions. The embedded boundary-scan cells preferably include an internal scan cell architecture. In a second embodiment, a second enabler works with a TAP emulator to allow testing of TAP-less DUTs.
展开▼