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首页> 外文期刊>IEEE Transactions on Dielectrics and Electrical Insulation >Research on property variation of silicone rubber and EPDM rubber under interfacial multi-stresses
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Research on property variation of silicone rubber and EPDM rubber under interfacial multi-stresses

机译:偶极多应力下硅橡胶和EPDM橡胶的性能变化研究

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In this paper, silicone rubber (SR) and ethylene propylene-diene monomer (EPDM) rubber used in 110 kV prefabricated joints of XLPE cables were chosen as subjects, and a multi-stress experimental device was set up to simulate the insulation interface. Different mechanical tensions and/or AC electrical stresses were applied to the rubber samples at the interface composed of XLPE and SR/EPDM. After preset times, microscopic observations, together with measurements of mechanical properties, volume resistivity, crosslinking degree, attenuated total reflectance Fourier infrared spectrum and X-ray photoelectron spectroscopy were performed. It is shown that for both materials, molecular chains are partly broken by electron or ion bombardment from the discharges under electrical stress, and micro-molecules and oxides are formed on the sample surfaces. The mechanical stress facilitates this process without changing the reaction essence. The volume characteristic parameters of SR samples degraded with aging, while those of EPDM samples remained relatively stable. It is shown that under the same interfacial electrical-mechanical stresses, SR samples shows degradation of the overall performance; while for EPDM samples, the damage occurs mainly on the surface. This is due to the different chain structures, filler types and content in the materials.
机译:本文选择了硅橡胶(Sr)和乙烯丙烯 - 二烯单体(EPDM)橡胶,用于110kV预制XLPE电缆接头的XLPE电缆接头,并设立多应力实验装置以模拟绝缘界面。将不同的机械张力和/或AC电应力施加到由XLPE和SR / EPDM组成的界面处的橡胶样品上。在预设时间后,进行微观观察,以及测量力学性能,体积电阻率,交联度,减弱的总反射率傅里叶红外光谱和X射线光电子能谱。结果表明,对于两种材料,分子链通过电子或离子轰击部分地破坏了电应力下的放电,并且在样品表面上形成微分子和氧化物。机械应力有助于这种过程而不改变反应本质。 SR样品的体积特性参数用老化降解,而EPDM样品的样品仍然相对稳定。结果表明,在相同的界面电力应力下,SR样品显示出整体性能的劣化;虽然对于EPDM样品,损坏主要发生在表面上。这是由于不同的链结构,填料类型和材料中的内容。

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