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Subsurface chemical nanoidentification by nano-FTIR spectroscopy

机译:纳米FTIR光谱底表面化学纳米鉴定

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Nano-FTIR spectroscopy based on Fourier transform infrared near-field spectroscopy allows for label-free chemical nanocharacterization of organic and inorganic composite surfaces. The potential capability for subsurface material analysis, however, is largely unexplored terrain. Here, we demonstrate nano-FTIR spectroscopy of subsurface organic layers, revealing that nano-FTIR spectra from thin surface layers differ from that of subsurface layers of the same organic material. Further, we study the correlation of various nano-FTIR peak characteristics and establish a simple and robust method for distinguishing surface from subsurface layers without the need of theoretical modeling or simulations (provided that chemically induced spectral modifications are not present). Our experimental findings are confirmed and explained by a semi-analytical model for calculating nano-FTIR spectra of multilayered organic samples. Our results are critically important for the interpretation of nano-FTIR spectra of multilayer samples, particularly to avoid that geometry-induced spectral peak shifts are explained by chemical effects.
机译:基于傅里叶变换红外近场光谱的纳米FTIR光谱允许无有机和无机复合表面的无标记的化学纳米孔化。然而,地下材料分析的潜在能力在很大程度上是未开发的地形。这里,我们展示了地下有机层的纳米FTIR光谱,揭示了来自薄表面层的纳米FTIR光谱与相同有机材料的地下层的纳米FTIR光谱不同。此外,我们研究了各种纳米FTIR峰特性的相关性,并建立了一种简单且鲁棒的方法,用于区分表面从地下层区分表面,而不需要理论上建模或模拟(所以提供化学诱导的光谱修改)。通过用于计算多层有机样品的纳米FTIR光谱来确认和解释我们的实验结果。我们的结果对于解释多层样品的纳米FTIR光谱来说至关重要,特别是为了避免通过化学效应解释几何诱导的光谱峰值偏移。

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