首页> 外文期刊>IFAC PapersOnLine >Multivariable Experiment Design with Application to a Wafer Stage: a Sequential Relaxation Approach for Dealing with Element-Wise Constraints ?
【24h】

Multivariable Experiment Design with Application to a Wafer Stage: a Sequential Relaxation Approach for Dealing with Element-Wise Constraints ?

机译:多变量实验设计应用于晶圆阶段:一种顺序放松方法,用于处理元素 - 明智的约束

获取原文
       

摘要

Optimal Experiment Design (OED) is an essential aspect in accurate Frequency Response Function (FRF) identification of complex systems. The aim of this paper is to optimally design experiments for FRF identification of multivariable motion systems subject to element-wise power constraints. This design problem involves solving a non-convex and generally NP-hard optimization problem. An algorithm to solving this problem approximately is presented based on sequential semi-definite relaxations. Experimental results on a wafer stage show an improvement of the FRF quality using the proposed techniques over traditional excitation design methods.
机译:最佳实验设计(OED)是复杂系统精确频率响应功能(FRF)识别的重要方面。本文的目的是最佳地设计用于经过元素明智的电源限制的多变量运动系统的FRF识别实验。这种设计问题涉及解决非凸和通常的NP硬度优化问题。求解该问题的算法大致基于顺序半确定性放松呈现。在晶片阶段的实验结果显示使用所提出的技术在传统的励磁设计方法上提高FRF质量。

著录项

相似文献

  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号