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Method for emissivity measurement of semitransparent coatings at ambient temperature

机译:环境温度下半透半透涂层发射率测量的方法

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Coatings deposited on a material surface are effective way of changing its surface properties. For increasing or decreasing radiation heat transfer, coatings with high or low emissivity are used. Measurement of spectral emissivity is a fundamental step to effective use of coatings for this application. Up to now the measurement methods are focused on bulk samples and mainly opaque ones. Here we present a method enabling measurement of emissivity of semitransparent coating itself, although it is deposited on a substrate. The method is based on measurement of transmittance and reflectance using an integration sphere system and Fourier transform infrared (FTIR) spectrometer for samples with two different coating thicknesses deposited on transparent substrates. Measured transmittance of the coating indicates spectral regions of potential emissivity differences using different substrates. From all the measured values, spectral emissivity can be characterized for different coating thicknesses. The spectral range of the method is from 2?μm to 20?μm. The measurement is done at ambient temperature enabling measurement of samples sensitive to heating like biomedical or nanocoatings. The method was validated on known bulk samples and an example of semitransparent coating measurement is shown on high-temperature high-emissivity coating.
机译:沉积在材料表面上的涂层是改变其表面性质的有效方式。为了增加或减少辐射热传递,使用具有高或低发射率的涂层。光谱发射率的测量是有效使用涂层的基本步骤。到目前为止,测量方法集中在散装样品上,主要是不透明的方法。在这里,我们介绍了一种能够测量半透明涂层本身的发射率的方法,尽管它沉积在基材上。该方法基于使用集成球系统和傅里叶变换红外(FTIR)光谱仪的透射率和反射率的测量,用于沉积在透明基板上的两个不同的涂层厚度的样品。涂层的测量透射率表示使用不同基板的潜在发射率差异的光谱区域。从所有测量值,光谱发射率都可以表征不同的涂层厚度。该方法的光谱范围为2Ωμm至20≤μm。测量是在环境温度下进行的,使得测量对像生物医学或纳米织物的加热敏感的样品。该方法在已知的本体样品上验证,并在高温高辐射涂层上示出了半透明涂层测量的实例。

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