SIMULTANEOUS MEASUREMENT METHOD OF EMISSIVITY, TRANSMISSIVITY, AND REFLECTIVITY PROPERTIES FOR TRANSPARENT OR SEMITRANSPARENT MATERIALS UNDER HIGH TEMPERATURE

摘要

in the high temperature samples translucent or transparent, according to an embodiment of the present invention, emissivity, transmissivity, reflectivity characteristics measured simultaneously method, calculating the sensitivity (R) of the test device on the basis of the copy volume (L _b ) of a black body; The emissivity ( _A ) and emissivity ( _B ) calculating a substrate material (B) having a low emissivity of the substrate material (A) having a high coefficient of radiant heat; And calculating the radiation (S _A ) of the sample in a translucent or transparent substrate material having a coefficient of radiant heat to the location (A) to the rear of the semi-transparent or transparent specimen predetermined temperature (T); Radiation of the substrate material having a low coefficient of radiant heat (B) was placed on the back side of the transparent or semi-transparent translucent or transparent specimen sample in the predetermined temperature (T) (S _B ) for calculating steps; The calculated sensitivity of the test device (R), the high emissivity ( _A ) of the substrate emissivity material (A), emissivity ( of the low-emissivity substrate material (B) _B ), the high relative to the predetermined temperature (in the sample in T) radiation (S _A ), and the low emissivity of the substrate material (B) on the substrate emissivity material (A) calculating the copy volume (S _B ) transmission of the sample using a semi-transparent or transparent (t _S ) of the sample at the predetermined temperature (T); Calculating an emissivity ( _S ) of the calculated the transmittance (t _S ) the sample using a semi-transparent or transparent; The calculated and the transmittance (t _S ) and the emissivity ( _S ) of the sample using a semi-transparent or transparent reflectivity (r _S ) for a step of calculating.